Norges billigste bøker

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Om Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Vis mer
  • Språk:
  • Engelsk
  • ISBN:
  • 9781681740249
  • Bindende:
  • Paperback
  • Sider:
  • 66
  • Utgitt:
  • 16. oktober 2015
  • Dimensjoner:
  • 256x177x8 mm.
  • Vekt:
  • 192 g.
  Gratis frakt
Leveringstid: 2-4 uker
Forventet levering: 20. januar 2025

Beskrivelse av Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.

Brukervurderinger av Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science



Finn lignende bøker
Boken Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science finnes i følgende kategorier:

Gjør som tusenvis av andre bokelskere

Abonner på vårt nyhetsbrev og få rabatter og inspirasjon til din neste leseopplevelse.