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Advances in Optical Surface Texture Metrology

Om Advances in Optical Surface Texture Metrology

Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Key Features  Cutting-edge advances in the fieldNew ISO framework for calibrationIncludes advances in artificial intelligenceIncludes advances in in-process measurement

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  • Språk:
  • Engelsk
  • ISBN:
  • 9780750325264
  • Bindende:
  • Hardback
  • Sider:
  • 198
  • Utgitt:
  • 11. desember 2020
  • Dimensjoner:
  • 178x254x13 mm.
  • Vekt:
  • 565 g.
  • BLACK NOVEMBER
  Gratis frakt
Leveringstid: 2-4 uker
Forventet levering: 19. desember 2024

Beskrivelse av Advances in Optical Surface Texture Metrology

Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis.

Key Features

Cutting-edge advances in the fieldNew ISO framework for calibrationIncludes advances in artificial intelligenceIncludes advances in in-process measurement

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