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This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling.
The new edition of this highly readable, popular textbook covers the fundamentals of crystallography, symmetry and diffraction and applies these concepts to a large range of materials. Now with new end-of-chapter exercises, more illustrations, more streamlined coverage of crystallography and additional coverage of magnetic point group symmetry.
This graduate level 2003 textbook covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text.
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